SJ/T 11499-2015.Test method for measuring electrical properties of monocrystalline silicon carbide. ...
SJ/T 11498-2015 重掺硅衬底中氧浓度的二次离子质谱测量方法
SJ/T 11498-2015.Test method for measuring oxygen contarmination in heavily doped silicon substrates ...
SJ/T 11497-2015 砷化镓晶片热稳定性的试验方法
SJ/T 11497-2015.Test method for thermal stability testing of gallium arsenide wafers. 1范围 SJ/T 11497...
SJ/T 11496-2015 红外吸收法测量砷化镓中硼含量
SJ/T 11496-2015.Determination of boron concentration in gallium arsenide by infrared absorption. 1范围...
SJ/T 11505-2015 蓝宝石单晶抛光片规范
SJ/T 11505-2015.Sapphire single crystal polished wafers specification. 1范围 SJ/T 11505规定了衬底和红外探测器窗口用蓝...
SJ/T 11504-2015 碳化硅单晶抛光片表面质量的测试方法
SJ/T 11504-2015.Test method for measuring surface quality of polished monocrystalline silicon carbid...
SJ/T 11503-2015 碳化硅单晶抛光片表面粗糙度的测试方法
SJ/T 11503-2015.Test methods for measuring surface roughness of polished monocrystalline silicon car...
SJ/T 11502-2015 碳化硅单晶抛光片规范
SJ/T 11502-2015.Specification for polished monocrystalline silicon carbide wafers. 1范围 SJ/T 11502规定了...
SJ/T 11501-2015 碳化硅单晶晶型的测试方法
SJ/T 11501-2015.Test method for determining crystal type of monocrystalline silicon carbide. 1范围 SJ/...
SJ/T 11510-2015 液晶显示器用铝腐蚀液
SJ/T 11510-2015.Aluminum etching solution for LCD. 1范围 SJ/T 11510规定了液晶显示器用铝腐蚀液的术语、性状、技术要求、试验方法、检验规则和...
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